Riccardo Tambone, Alessandro Ferrara, Filippo Magrini, Andreas Hoffmann, Andrew Wood, Gerhard Noebauer, Elmar Gondro, and Ray Hueting: Distributed field plate effects in trench MOSFETs.
In IEEE 35th International Conference on Microelectronic Test Structures (ICMTS'2023),
Tokyo, Japan, March 2023.
Elmar Gondro, Joost Willemen, Peter Bauer: A novel Approach to measure and model Plasma Noise in Avalanche Diodes.
In IEEE 52th European Solid-State Device Research Conference (ESSDERC'2022),
Seiten 312-315, Milan, Italy, September 2022. download (pdf):Publikation / Paper *
Vortrag / Presentation
Volker Glöckel, Elmar Gondro: Advances in Statistical Compact Modeling. MOS-AK 2018,
Neubiberg, Germany, 13. March 2018. download (pdf):Presentation
Simone Locci, Klaus-Willi Pieper und Elmar Gondro: A least squares based methodology for the extraction of corner model parameters. 13. ITG/GMM-Fachtagung Analog 2013
Entwicklung von Analogschaltungen mit CAE-Methoden (ANALOG'2013),
Aachen, Germany, March 2013. download (pdf):Publikation / Paper
Elmar Gondro, Klaus-Willi Pieper, Simone Locci und Matthias Sylvester: Corner Parameter Generation with WiCkeD. MunEDA User Group Meeting (MUGM'2012),
Munich, Germany, October 2012. download (pdf):Presentation
Klaus-Willi Pieper und Elmar Gondro: An effective method of solving the covariance equation for statistical modeling.
In IEEE Semiconductor Conference Dresden (SCD'2011),
Dresden, Sachsen, Germany, September 2011. download (pdf):Publikation / Paper *
Poster
Elmar Gondro, Axel Schmidt, Oskar Kowarik, Rainer Kraus und Kurt Hoffmann: Influence of the Inner Miller-Effect on the Input Capacitance of CMOS Transistors.
In IEEE 32th European Solid-State Device Research Conference (ESSDERC'2002),
Florence, Italy, September 2002. download (pdf):Publikation / Paper
Elmar Gondro, Oskar Kowarik, Gerhard Knoblinger und Peter Klein: When do we need Non-Quasistatic CMOS RF-Models?
In IEEE Custom Integrated Circuit Conference (CICC'2001),
Seiten 377-380, San Diego, Kalifornien, USA, Mai 2001.
Elmar Gondro, Franz Schuler, Oskar Kowarik und Christian Kühn: Physics Based Fatigue Compact Model for Ferroelectric Capacitors.
In IEEE International Symposium on the Applications of Ferroelectrics (ISAF'2000),
Honolulu, Hawaii, USA, August 2000. download (pdf):Publikation / Paper *
Poster
Christian Kühn, H. Hönigschmid, Oskar Kowarik, Elmar Gondro und Kurt Hoffmann: A Dynamic Ferroelectric Capacitance Model for Circuit Simulators.
In IEEE International Symposium on the Applications of Ferroelectrics (ISAF'2000),
Honolulu, Hawaii, USA, August 2000. download (pdf):Publikation / Paper *
Poster
Elmar Gondro, Peter Klein und Franz Schuler: An Analytical Source-and-Drain Series Resistance Model of Quarter Micron MOSFETs and its Influence on Circuit Simulation.
In IEEE International Symposium on Circuits and Systems (ISCAS'99),
Band 6, Seiten 206-209, Orlando, Florida, USA, Mai/Juni 1999. download (pdf):Publikation / Paper *
Vortrag / Presentation
Elmar Gondro, Peter Klein, Franz Schuler und Oskar Kowarik: A Non-Linear Description of the Bias Dependent Parasitic Resistances of Quarter Micron MOSFETs.
In S. Shaari (Herausgeber): IEEE International Conference on Semiconductor Electronics (ICSE'98),
Seiten 97-99, Bangi, Malaysien, November 1998.
Electron Device Chapter, IEEE Malaysia Section, Institute of Electrical and Electronics Engineers Inc., Malaysia Section. download (pdf):Publikation / Paper *
Vortrag / Presentation
Elmar Gondro, Franz Schuler und Peter Klein: A Physics Based Resistance Model of the Overlap Regions in LDD-MOSFETs.
In K. De Meyer and S. Biesemans (Herausgeber): Simulation of Semiconductor Processes and Devices (SISPAD'98),
Seiten 267-270, Leuven, Belgien, September 1998.
Springer-Verlag Wien New York. download (pdf):Publikation / Paper *
Vortrag / Presentation